About this scholarly article

2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Analysis of Interface Trap Charges of Double Gate Junctionless Nanowire Transistor (DG-JNT)for Digital Circuit Applications by Garg, Neha; Pratap, Yogesh; Gupta, Mridula; Kabra, Sneha is a scholarly article available to read on EtoBox.

Author

Garg, Neha; Pratap, Yogesh; Gupta, Mridula; Kabra, Sneha

Publisher

IEEE

Published

2018

Language

EN