About this scholarly article

2014 9th International Design and Test Symposium (IDT) - An independent dual gate SOI FinFET soft-error resilient memory cell by Eftaxiopoulos, N.; Axelos, N.; Zervakis, G.; Tsoumanis, K.; Pekmestzi, K. is a scholarly article available to read on EtoBox.

Author

Eftaxiopoulos, N.; Axelos, N.; Zervakis, G.; Tsoumanis, K.; Pekmestzi, K.

Publisher

IEEE

Published

2014

Language

EN