About this scholarly article

Proceedings. Design, Automation and Test in Europe Conference and Exhibition - Z-sets and z-detections: circuit characteristics that simplify fault diagnosis by Pomeranz, I.; Venkataraman, S.; Reddy, S.M.; Seshadri, B. is a scholarly article available to read on EtoBox.

Author

Pomeranz, I.; Venkataraman, S.; Reddy, S.M.; Seshadri, B.

Publisher

IEEE Comput. Soc

Published

2004

Language

EN