Skip to content

Opening book details…

About this Engineering article

Application of vapor phase decomposition techniques (VPD/AAS and ICP-MS) for trace element analysis in oxide coatings on silicon by Samantha H. Tan is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Samantha H. Tan
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
Published
1995
Field
Engineering (Physical Sciences)

More by Samantha H. Tan

Browse all works by Samantha H. Tan