About this scholarly article

Tenth Biennial University/Government/Industry Microelectronics Symposium - Research Triangle Park, NC, USA (18-19 May 1993)] [1993] Proceedings of the Tenth Biennial University/Government/Industry Microelectronics Symposium - Wafer level detecting of Idd failures in CMOS ASICs using liquid crystal techniques by Ma, J.; Haley, M.W.; Mitchell, T.W.; Sanchez, I. is a scholarly article available to read on EtoBox.

Author

Ma, J.; Haley, M.W.; Mitchell, T.W.; Sanchez, I.

Publisher

IEEE

Published

1993