About this scholarly article

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - An accurate RF CMOS gate resistance model compatible with HSPICE by Lin, H.W.; Chung, S.S.; Wong, S.C.; Huang, G.W. is a scholarly article available to read on EtoBox.

Author

Lin, H.W.; Chung, S.S.; Wong, S.C.; Huang, G.W.

Publisher

IEEE

Published

2004