About this scholarly article

SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III - Eglin virtual range database for hardware-in-the-loop testing by Talele, Sunjay E.; Pickard, Jr., J. W.; Owens, Monte A.; Foster, Joseph; Watson, John S.; Amick, Mary Amenda; Anthony, Kenneth; Murrer, Jr., Robert Lee is a scholarly article available to read on EtoBox.

Author

Talele, Sunjay E.; Pickard, Jr., J. W.; Owens, Monte A.; Foster, Joseph; Watson, John S.; Amick, Mary Amenda; Anthony, Kenneth; Murrer, Jr., Robert Lee

Publisher

SPIE

Published

1998

Language

EN