About this scholarly article

22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Razor: a tool for post-silicon scan ATPG pattern debug and its application by Nayak, D.; Venkataraman, S.; Thadikaran, P. is a scholarly article available to read on EtoBox.

Author

Nayak, D.; Venkataraman, S.; Thadikaran, P.

Publisher

IEEE

Published

2004

Language

EN