About this scholarly article

2017 6th International Symposium on Next Generation Electronics (ISNE) - Design for hot-carrier reliability of HV UMOS by Aryadeep, Chirag; Sheu, Gene; Selvendran, Sivaji; Jaiswal, Suman; Krishna Sai, S.; Mastanbasheer, Shaik; Sai Dheeraj, Muntha; Chen, Po-An is a scholarly article available to read on EtoBox.

Author

Aryadeep, Chirag; Sheu, Gene; Selvendran, Sivaji; Jaiswal, Suman; Krishna Sai, S.; Mastanbasheer, Shaik; Sai Dheeraj, Muntha; Chen, Po-An

Publisher

IEEE

Published

2017