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About this Engineering article
Accelerated Life-tests for Intermittent Destructive Inspection, with Logistic Failure-distribution by So Young Sohn is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- So Young Sohn
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9529)
- Published
- 1997
- Field
- Engineering (Physical Sciences)