About this scholarly article

SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Physics and Simulation of Optoelectronic Devices IV - Reflectance-difference spectroscopy: a technique for characterization of dislocations in semiconductors by Lastras-Martinez, Luis F.; Lastras-Martinez, Alfonso; Chow, Weng W.; Osinski, Marek is a scholarly article available to read on EtoBox.

Author

Lastras-Martinez, Luis F.; Lastras-Martinez, Alfonso; Chow, Weng W.; Osinski, Marek

Publisher

SPIE

Published

1996

Language

EN