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About this Materials Science article
Bias Stress Effects Investigated in Charge Depletion and Accumulation Regimes for Inkjet-printed Perylene Diimide Organic Transistors by Grimaldi, I.A.; Barra, M.; Carella, A.; Di Girolamo, F.V.; Loffredo, F.; Minarini, C.; Villani, F.; Cassinese, A. is a Materials Science article available to read on EtoBox.
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- Author
- Grimaldi, I.A.; Barra, M.; Carella, A.; Di Girolamo, F.V.; Loffredo, F.; Minarini, C.; Villani, F.; Cassinese, A.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0379-6779)
- Published
- 2013
- Field
- Materials Science (Physical Sciences)