About this scholarly article

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Three-dimensional vision using structured light applied to quality control in production line by Bieri, Louis-Severin; Osten, Wolfgang; Takeda, Mitsuo; Jacot, Jacques is a scholarly article available to read on EtoBox.

Author

Bieri, Louis-Severin; Osten, Wolfgang; Takeda, Mitsuo; Jacot, Jacques

Publisher

SPIE

Published

2004

Language

EN