About this scholarly article

2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) - Proton radiation damage in p-channel CCDs fabricated on high- resistivity silicon by Bebek, C.; Groom, D.; Holland, S.; Karcher, A.; Kolbe, W.; Lee, J.; Levi, M.; Palaio, N.; Turko, B.; Uslenghi, M.; Wagner, M.; Wang, G. is a scholarly article available to read on EtoBox.

Author

Bebek, C.; Groom, D.; Holland, S.; Karcher, A.; Kolbe, W.; Lee, J.; Levi, M.; Palaio, N.; Turko, B.; Uslenghi, M.; Wagner, M.; Wang, G.

Publisher

IEEE

Published

2002