About this scholarly article

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - New developments in synchrotron-based microtomography by Stampanoni, Marco; Bonse, Ulrich; Abela, Rafael; Borchert, Gunther; Patterson, Bruce D. is a scholarly article available to read on EtoBox.

Author

Stampanoni, Marco; Bonse, Ulrich; Abela, Rafael; Borchert, Gunther; Patterson, Bruce D.

Publisher

SPIE

Published

2004

Language

EN