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About this Engineering article
Temperature and Electric Field Characteristics of Time-dependent Dielectric Breakdown for Silicon Dioxide and Reoxidized-nitrided Oxides by Chi-Hung Lin; Cable, J.; Woo, C.S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chi-Hung Lin; Cable, J.; Woo, C.S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1995
- Language
- EN
- Field
- Engineering (Physical Sciences)