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About this Engineering article
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures by Augusto Tazzoli; Marco Barbato; Vincenzo Ritrovato; Gaudenzio Meneghesso is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Augusto Tazzoli; Marco Barbato; Vincenzo Ritrovato; Gaudenzio Meneghesso
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3886)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)
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