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About this Engineering article
Test Points Selection for Analog Fault Dictionary Techniques by Chenglin Yang; Shulin Tian; Bing Long is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chenglin Yang; Shulin Tian; Bing Long
- Publisher
- Springer US; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC (ISSN 0923-8174)
- Published
- 2009
- Language
- EN
- ISBN
- 9781083600851
- Field
- Engineering (Physical Sciences)