Skip to content

Opening book details…

About this scholarly article

2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Advanced extraction procedure for parasitic collector series resistance contributions in high-speed BiCMOS technologies by Stein, F.; Derrier, N.; Maneux, C.; Celi, D. is a scholarly article available to read on EtoBox.

Author
Stein, F.; Derrier, N.; Maneux, C.; Celi, D.
Publisher
IEEE
Published
2013
Language
EN

More by Stein, F.; Derrier, N.; Maneux, C.; Celi, D.

Browse all works by Stein, F.; Derrier, N.; Maneux, C.; Celi, D.