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About this Engineering article
Sequential Test for Reliability Under Allowance for Target Uncertainty by Michlin, Y. H.; Ingman, D.; Levin-David, Lilach is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Michlin, Y. H.; Ingman, D.; Levin-David, Lilach
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9529)
- Published
- 2012
- Field
- Engineering (Physical Sciences)
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