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About this Engineering article
Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs by Kim, Y. D.; Choi, S. G.; Klein, M. V.; Yoo, S. D.; Aspnes, D. E.; Xin, S. H.; Furdyna, J. K. is a Engineering article available to read on EtoBox.
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- Author
- Kim, Y. D.; Choi, S. G.; Klein, M. V.; Yoo, S. D.; Aspnes, D. E.; Xin, S. H.; Furdyna, J. K.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1997
- Field
- Engineering (Physical Sciences)