About this scholarly article

2016 IEEE East-West Design & Test Symposium (EWDTS) - No-reference image quality assessment based on local binary patterns by Nenakhov, I.; Khryashchev, V.; Priorov, A. is a scholarly article available to read on EtoBox.

Author

Nenakhov, I.; Khryashchev, V.; Priorov, A.

Publisher

IEEE

Published

2016