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About this Engineering article
High reliability InGaP/GaAs HBT by Pan, N.; Elliott, J.; Knowles, M.; Vu, D.P.; Kishimoto, K.; Twynam, J.K.; Sato, H.; Fresina, M.T.; Stillman, G.E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Pan, N.; Elliott, J.; Knowles, M.; Vu, D.P.; Kishimoto, K.; Twynam, J.K.; Sato, H.; Fresina, M.T.; Stillman, G.E.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)