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About this Engineering article
Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics by Xiang, Y. (author);Bardon, M. Garcia (author);Kaczer, B. (author);Alam, Md Nur K. (author);Ragnarsson, L.-A. (author);Kaczmarek, K. (author);Parvais, B. (author);Groeseneken, G. (author);Van Houdt, J. (author) is a Engineering article available to read on EtoBox.
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- Author
- Xiang, Y. (author);Bardon, M. Garcia (author);Kaczer, B. (author);Alam, Md Nur K. (author);Ragnarsson, L.-A. (author);Kaczmarek, K. (author);Parvais, B. (author);Groeseneken, G. (author);Van Houdt, J. (author)
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Published
- 2021
- Field
- Engineering (Physical Sciences)