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Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference - Challenges in Globally Distributed Design Teams: A Case Study by Hayes, C. C. is a scholarly article available to read on EtoBox.

Author
Hayes, C. C.
Publisher
ASMEDC
Published
2007
Language
EN

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