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Quantitative characterization of the optical properties of absorbing polymer films: Comparative investigation of the internal reflection intensity analysis method by Tao Liu; Clifford L. Henderson; Robert Samuels is a Materials Science article available to read on EtoBox.

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## Abstract Nondestructive, three‐dimensional refractive‐index measurements are used for the determination of both the crystallinity and orientation in thin polymer films. The prism wave‐guide coupler is particularly suited for three‐dimensional isotropic and anisotropic thin‐film studies because of the quantitative character of the information obtained and the ease of data acquisition. It has been limited, however, to determining only the refractive index of transparent or weakly absorbing thin‐film samples. On the basis of thin‐film optics, this study develops a new internal reflection intensity analysis (IRIA) method, which uses the intensity information rather than the conventional mode angle values to acquire both the refractive index and the extinction coefficient over a range of transparent to highly absorbing polymer films. Therefore, the IRIA method overcomes the limitations of this prism wave‐guide coupler technique, which can only measure the refractive index of a weakly absorbing sample. With a Metricon PC‐2010 as the skeletal framework, a prototype instrument has been developed to apply and test the IRIA method. A study comparing both the refractive index and extinctio

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Author

Tao Liu; Clifford L. Henderson; Robert Samuels

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0887-6266)

Published

2003

Language

EN

Field

Materials Science (Physical Sciences)