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About this Computer Science article
AccAnn: A New Subjective Assessment Methodology for Measuring Acceptability and Annoyance of Quality of Experience by Li, Jing; Krasula, Lukas; Yoann, Baveye; Li, Zhi; Le Callet, Patrick is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Li, Jing; Krasula, Lukas; Yoann, Baveye; Li, Zhi; Le Callet, Patrick
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1520-9210)
- Published
- 2019
- Language
- EN
- Field
- Computer Science (Physical Sciences)
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