About this scholarly article

2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - An efficient architecture for accumulator-based test generation of SIC pairs by Voyiatzis, I.; Efstathiou, C. is a scholarly article available to read on EtoBox.

Author

Voyiatzis, I.; Efstathiou, C.

Publisher

IEEE

Published

2008

Language

EN