About this scholarly article

SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical devices and Systems - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices… by Li, Mujun; Han, Sen; Kameyama, Masaomi; Shen, Lianguan; Zheng, Jinjin; Luo, Xiangang; Zhao, Wei is a scholarly article available to read on EtoBox.

Author

Li, Mujun; Han, Sen; Kameyama, Masaomi; Shen, Lianguan; Zheng, Jinjin; Luo, Xiangang; Zhao, Wei

Publisher

SPIE

Published

2009