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About this Engineering article
Increasing Thermal Rating by Risk Analysis by Wan, H.; McCalley, J.D.; Vittal, V. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wan, H.; McCalley, J.D.; Vittal, V.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-8950)
- Published
- 1999
- Field
- Engineering (Physical Sciences)