About this scholarly article

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Structured lighting method using moire pattern projection by Yoshizawa, Toru; Yamaguchi, Takayoshi; Takahashi, Hiroshi; Ikeda, Naohito; Yamamoto, Masayuki; Nagamori, Shigeru; Harding, Kevin G.; Miller, John W. V. is a scholarly article available to read on EtoBox.

Author

Yoshizawa, Toru; Yamaguchi, Takayoshi; Takahashi, Hiroshi; Ikeda, Naohito; Yamamoto, Masayuki; Nagamori, Shigeru; Harding, Kevin G.; Miller, John W. V.

Publisher

SPIE

Published

2002

Language

EN