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Transient Electromagnetic-Thermal Nondestructive Testing by Yunze He; Bin Gao; Ali Sophian; Ruizhen Yang is a scholarly article available to read on EtoBox.

What is Transient Electromagnetic-Thermal Nondestructive Testing about?

Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth. In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan, B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM). The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields. Presents two kinds of transient NDT testing, from theory and methodology, to applications Includes time domain frequency domain and logarithm domain, which ar

Author

Yunze He; Bin Gao; Ali Sophian; Ruizhen Yang

Publisher

Elsevier ; National Defense Industry Press

Published

2017

Language

EN

ISBN

9780128128367