About this scholarly article

2011 Asian Test Symposium - Failure Analysis and Test Solutions for Low-Power SRAMs by Zordan, L.B.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Badereddine, N. is a scholarly article available to read on EtoBox.

Author

Zordan, L.B.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Badereddine, N.

Publisher

IEEE

Published

2011