About this scholarly article

Integrated Force and Displacement Sensing in Active Microcantilevers for Off-resonance Tapping Mode Atomic Force Microscopy by Bem, Nata F. S. de ;Ruppert, Michael G. ;Yong, Yuen K. ;Fleming, Andrew J. is a scholarly article available to read on EtoBox.

Author

Bem, Nata F. S. de ;Ruppert, Michael G. ;Yong, Yuen K. ;Fleming, Andrew J.

Publisher

IEEE

Published

2020