About this scholarly article

2006 IEEE International Symposium on Circuits and Systems - Effective tunneling capacitance: a new metric to quantify transient gate leakage current by Kougianos, E.; Mohanty, S.P. is a scholarly article available to read on EtoBox.

Author

Kougianos, E.; Mohanty, S.P.

Publisher

IEEE

Published

2006

Language

EN