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About this Engineering article
Radiation induced electron and hole traps in thermal SiO2 by V.V. Afanas'ev; J.M.M. de Nijs; A. Stesmans; P. Balk is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- V.V. Afanas'ev; J.M.M. de Nijs; A. Stesmans; P. Balk
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 1995
- Field
- Engineering (Physical Sciences)
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