About this scholarly article

2019 Latin American Electron Devices Conference (LAEDC) - Influence of fin width and back bias on the low-frequency noise of long channel SOI nanowires by Molto, Allan Roberto; Paz, Bruna Cardoso; Pavanello, Marcelo Antonio is a scholarly article available to read on EtoBox.

Author

Molto, Allan Roberto; Paz, Bruna Cardoso; Pavanello, Marcelo Antonio

Publisher

IEEE

Published

2019

Language

EN