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Structural investigation of pristine and annealed nanocrystalline TiO~2~ thin films by X‐ray diffraction and Raman spectroscopy by A. Orendorz; A. Brodyanski; J. Lösch; L. H. Bai; Z. H. Chen; Y. K. Le; C. Ziegler; H. Gnaser is a Engineering article available to read on EtoBox.

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## Abstract Nanocrystalline anatase TiO~2~ films were prepared from colloidal suspensions using particles with a nominal size of 12 nm. Their structure was examined by Raman spectroscopy and X‐ray diffraction (XRD). The as‐prepared specimens exhibit exclusively features due to the anatase phase of TiO~2~ (e.g., the E~g~, B~1g~ and A~1g~ vibration modes in Raman spectroscopy and the characteristic diffraction peaks in XRD). Isochronal annealing of the films in air at temperatures of up to 1320 K effected clear structural changes, observed both in Raman and XRD: the crystallite size increases from ∼13 nm to ∼125 nm between 470 K and 1220 K, with the crystallites remaining in the anatase phase. A phase transition to the rutile phase of TiO~2~ occurs gradually in the temperature range 1220 – 1320 K and the average crystallite size increases to ∼160 nm. The E~g~ vibration in anatase films reveals a blue shift and an asymmetric peak broadening towards higher frequencies for smaller particle size/lower annealing temperatures. A power‐law dependence between the Raman peak width and the inverse of the crystallite size is found. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Author

A. Orendorz; A. Brodyanski; J. Lösch; L. H. Bai; Z. H. Chen; Y. K. Le; C. Ziegler; H. Gnaser

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Wiley (ISSN 1862-6351)

Published

2007

Language

EN

Field

Engineering (Physical Sciences)