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About this Engineering article
Improvement of bias-stability in amorphous-indium-gallium-zinc-oxide thin-film transistors by using solution-processed Y2O3 passivation by An, Sungjin; Mativenga, Mallory; Kim, Youngoo; Jang, Jin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- An, Sungjin; Mativenga, Mallory; Kim, Youngoo; Jang, Jin
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2014
- Field
- Engineering (Physical Sciences)
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