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About this scholarly article
14th International Conference on Parallel Architectures and Compilation Techniques (PACT'05) - Exploiting coarse-grain verification parallelism for power-efficient fault tolerance by Rashid, M.W.; Tan, E.J.; Huang, M.C.; Albonesi, D.H. is a scholarly article available to read on EtoBox.
- Author
- Rashid, M.W.; Tan, E.J.; Huang, M.C.; Albonesi, D.H.
- Publisher
- IEEE
- Published
- 2005
- Language
- EN
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