About this scholarly article

2018 IEEE International Conference on Electro/Information Technology (EIT) - Wavelet Denoising in Industrial Tomography by Silva, Ivan B.; Petraglia, Mariane R.; Petraglia, Antonio is a scholarly article available to read on EtoBox.

Author

Silva, Ivan B.; Petraglia, Mariane R.; Petraglia, Antonio

Publisher

IEEE

Published

2018