Opening book details…
About this Engineering article
Pile-up Correction in Characterizing Single-photon Avalanche Diodes of High Dark Count Rate by Ding, Xun; Zang, Kai; Fei, Yueyang; Zheng, Tianzhe; Su, Tao; Morea, Matthew; Jin, Ge; Harris, James S.; Jiang, Xiao; Zhang, Qiang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ding, Xun; Zang, Kai; Fei, Yueyang; Zheng, Tianzhe; Su, Tao; Morea, Matthew; Jin, Ge; Harris, James S.; Jiang, Xiao; Zhang, Qiang
- Publisher
- Springer; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC (ISSN 0306-8919)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)