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About this Engineering article
Single event upset sensitivity of 45 nm FDSOI and SOI FinFET SRAM by Tang, Du; Li, YongHong; Zhang, GuoHe; He, ChaoHui; Fan, YunYun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tang, Du; Li, YongHong; Zhang, GuoHe; He, ChaoHui; Fan, YunYun
- Publisher
- SP Science China Press; Science in China Press (SCP); Springer-Verlag; Springer Verlag; Zhongguo Kexue Zazhishe/Science in China Press; Springer Science and Business Media LLC; Science China Press., Co. Ltd. (ISSN 1006-9321)
- Published
- 2013
- Field
- Engineering (Physical Sciences)
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