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About this Engineering article
Influence of Annealing, Oxidation and Doping on Conduction-Band near Interface Traps in 4H-SiC Characterized by Low Temperature Conductance Measurements by Noll, Stefan; Rambach, Martin; Grieb, Michael; Scholten, Dick; Bauer, Anton; Frey, Lothar is a Engineering article available to read on EtoBox.
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- Author
- Noll, Stefan; Rambach, Martin; Grieb, Michael; Scholten, Dick; Bauer, Anton; Frey, Lothar
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2015
- Field
- Engineering (Physical Sciences)