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About this Engineering article
Far-field Measurements and Maximum Entropy Analysis of Lossy Material on a Conducting Plate by Walton, E.K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Walton, E.K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-926X)
- Published
- 1989
- Language
- EN
- Field
- Engineering (Physical Sciences)