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About this Engineering article
Volatilization and Transport Mechanisms During Cr Oxidation at 300 °C Studied In Situ by ToF-SIMS by Poulain, Clément; Seyeux, Antoine; Voyshnis, Svetlana; Marcus, Philippe is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Poulain, Clément; Seyeux, Antoine; Voyshnis, Svetlana; Marcus, Philippe
- Publisher
- Springer-Verlag; Kluwer Academic/Plenum Publishers; Springer Science and Business Media LLC (ISSN 0030-770X)
- Published
- 2017
- Field
- Engineering (Physical Sciences)
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