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Direct Extraction of InP/GaAsSb/InP DHBT Equivalent-Circuit Elements From $S$-Parameters Measured at Cut-Off and Normal Bias Conditions by Johansen, Tom K.; Leblanc, Remy; Poulain, Julien; Delmouly, Vincent is a Engineering article available to read on EtoBox.

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Author
Johansen, Tom K.; Leblanc, Remy; Poulain, Julien; Delmouly, Vincent
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9480)
Published
2016
Language
EN
Field
Engineering (Physical Sciences)

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