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Using Molecular Modeling Trending to Understand Dielectric Susceptibility in Dielectrics for Display Applications by Iwamoto, Nancy; Yuen, Matthew M.F.; Fan, Haibo is a scholarly article available to read on EtoBox.

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"Molecular Modeling and Multiscaling Issues for Electronic Material Applications provides a snapshot on the progression of molecular modeling in the electronics industry and how molecular modeling is currently being used to understand material performance to solve relevant issues in this field. This book is intended to introduce the reader to the evolving role of molecular modeling, especially seen through the eyes of the IEEE community involved in material modeling for electronic applications. Part I presents the role that quantum mechanics can play in performance prediction, such as properties dependent upon electronic structure, but also shows examples how molecular models may be used in performance diagnostics, especially when chemistry is part of the performance issue. Part II gives examples of large-scale atomistic methods in material failure and shows several examples of transitioning between grain boundary simulations (on the atomistic level)and large-scale models including an example of the use of quasi-continuum methods that are being used to address multiscaling issues. Part III is a more specific look at molecular dynamics in the determination of the thermal conduc

Author

Iwamoto, Nancy; Yuen, Matthew M.F.; Fan, Haibo

Publisher

Springer US

Published

2012

Language

EN

ISBN

9781280397196