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About this Engineering article
Formation, properties, and ion irradiation effects of hexagonal structure MoN thin films by Christen, D.; Sekula, S.; Ellis, J.; Lewis, J.; Williams, J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Christen, D.; Sekula, S.; Ellis, J.; Lewis, J.; Williams, J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 1987
- Language
- EN
- Field
- Engineering (Physical Sciences)
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