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About this Materials Science article
Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis by Allaz, Julien M.; Williams, Michael L.; Jercinovic, Michael J.; Goemann, Karsten; Donovan, John is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Allaz, Julien M.; Williams, Michael L.; Jercinovic, Michael J.; Goemann, Karsten; Donovan, John
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2019
- Field
- Materials Science (Physical Sciences)